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3800-MK2 automated programming system combines universal programming technology, 8th gen., with a fine-pitch handling system. Reportedly is capable of processing programmable devices from the largest QFP to the smallest WLBGA. Includes vision and pneumatic systems that provide VSP support. Provides accuracy and repeatability for packages as small as 1mm x 0.5mm. Can simultaneously support tape, tray, tube and marking.
BPM Microsystems, www.bpmmicro.com
3800-MK2 automated programming system combines universal programming technology, 8th gen., with a fine-pitch handling system. Reportedly is capable of processing programmable devices from the largest QFP to the smallest WLBGA. Includes vision and pneumatic systems that provide VSP support. Provides accuracy and repeatability for packages as small as 1mm x 0.5mm. Can simultaneously support tape, tray, tube and marking.
BPM Microsystems, www.bpmmicro.com
5860 multi-strategy test system combines analogue in-circuit test and functional test capabilities. Combines panel and larger cabinet space for additional instrumentation. When coupled with inline fixture, it provides automated production test solution. Is SMEMA-compliant.
Aeroflex Holding Corp., www.aeroflex.com
5860 multi-strategy test system combines analogue in-circuit test and functional test capabilities. Combines panel and larger cabinet space for additional instrumentation. When coupled with inline fixture, it provides automated production test solution. Is SMEMA-compliant.
Aeroflex Holding Corp., www.aeroflex.com
Multi-Site configurations of TestStation in-circuit test system are available. Support parallel test of two or more boards. Are available for automated inline and manual offline use. Feature zero-footprint test head that fits within existing handler enclosure. Deliver parallel testing for 6-wire performance analog and digital in-circuit test, functional test, boundary scan, flash programming and parametric test options.
Teradyne, www.teradyne.com
Multi-Site configurations of TestStation in-circuit test system are available. Support parallel test of two or more boards. Are available for automated inline and manual offline use. Feature zero-footprint test head that fits within existing handler enclosure. Deliver parallel testing for 6-wire performance analog and digital in-circuit test, functional test, boundary scan, flash programming and parametric test options.
Teradyne, www.teradyne.com
Press Releases
- ViTrox Americas Welcomes Doug Ennis as Senior Field Applications & Service Engineer
- Altus Adds LPKF CuttingMaster 3290 to Depaneling Portfolio
- Kurtz Ersa Partners with E-tronix for Sales in Illinois and Wisconsin
- XLR8 EMS Welcomes Raul Jorge Lopez Jr. as Director of Program Management and Procurement