RVSI Inspection will showcase the WS-2800 Wafer Inspection System in HTL Co.’s booth, #10A-101, at the Semicon Japan show, taking place Dec. 7-9.
 
WS-2800 is said to provide superior yield management for defect inspection throughout post-fab processes for both standard and flip chip wafers up to 200 mm in diameter.
 
Defects created in the post-fab area between wafer processing and final manufacturing can negatively impact production yields and time-to-market. The inspection system locates wafer defects and classifies them to reduce process costs and improve yield.
 
Benefits include: high-speed surface defect inspection, 100% inspection that ensures no escapes and an integrated inspection tool for fast response to process variations.
 
RVSI Inspection, rvsi.com

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