The Micromex submicron, high-resolution system is optimized for manual and semi-automated solder joint inspection of BGA, CSP, MLF and QFP components. Has an integrated 2 megapixels camera, open 160kV or 180kV submicron x-ray tube and total magnification of up to 13.3X for process control and failure analysis of PCB assemblies.
 
Comes with new inspection software, quality|assurance 2006. This software automates inspection of PCB assemblies, making pass/fail decisions for BGA, CSP, MLF and QFP without operator interpretations, reducing the numbers of false identifications while speeding throughput and improving efficiency. A powerful algorithm toolbox XE offers solutions for application testing. 
 
Possesses high precision manipulation through its 360° rotation axis and the ability for oblique views up to 70°. A scanning area of 18x14” allows samples with a size up to 26.75 x 25” (680 x 635 mm) with weights of up to 11 lbs. (5 kg). 
 

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