X-Tek Group will announce the addition of Computerised Tomography (CT), a 3-D imaging capability, to the Revolution microfocus system at Nepcon Shenzhen. The system features true concentric imaging, the highest degree of off axis tilt available and NanoTech open tube technology for unparalleled resolution and magnification. Visitors can also find out more about the group’s new operation in Hong Kong.

CT produces high resolution 3-D data sets which can be viewed at any angle, sliced in any direction and measured to enable detailed analysis of the internal structure of a wide range of components and objects.

Offers a viewing angle of up to 75^o, just 15^o to the plane of the board. This allows for maximum magnification (up to 6000x) at all angles over the entire 16 x 16” (410 x 410mm) manipulator scan area, for 100% BGA, µBGA, multilayer board and PCB solder joint inspection, with quick analysis of BGA ball wetting, attachment, cracks and delaminations. NanoTech source offers improved defect detection due to feature recognition in the submicron range.

Has advanced triple-mode programming interface incorporating off-line, teach-repeat and high level library function for program building.

X-Tek, xtekxray.com
Nepcon Shenzhen Stand 2B73

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