The ScanExpress JET test tool combines boundary-scan and functional test. Combines common pin and net-level diagnostics using boundary-scan testing with CPU emulation testing through its JTAG port. Provides functional test capabilities on designs using JTAG-compatible CPUs and even non-JTAG peripheral components. Structural tests for opens and shorts reportedly can be performed via boundary-scan, while at-speed functional testing can be performed using the CPU to run test programs loaded into memory. Uses proprietary techniques to test on-board memory at speed without loading code into memory; can test and diagnose faulty boards and systems even when the embedded CPU is not able to boot and board self-test is not operational. Users can access pre-built functional tests or create functional test scripts from scratch to test nonstandard parts.
 
Corelis, www.corelis.com
 
 
 

• Prev
• Next