Circuits Assembly Online Magazine

	CAVEAT LECTOR For EDA, it’s back to the future. Mike Buetow		ROI Data miners have much in common with manufacturers. Peter Bigelow
	DEFECTS DATABASE Champagne voiding: The not-so-tasty treat. Martin Wickham		SMART FACTORY Reducing labor content and defects in SMT. Ranko Vujosevic, Ph.D.
	TEST AND INSPECTION CT: Time-intensive, but worth it. David Bernard, Ph.D.		TEST AND INSPECTION The benefits of old. Robert Boguski
	GETTING LEAN Mixed-technology designs are prime for waste elimination. Here’s how. Allen Abell