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SCI-MCC (mask condition checker) is designed for metal stencil opening inspection.

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CSM2512 current sense resistor offers a metal element with TCR now improved to 50ppm.

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PNA and PNA-X network analyzers contain low-spurious direct digital synthesis source, enabling accurate measurements with less phase noise interference.

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ScanWorks v. 4.8 JTAG-based hardware debug, validation and test tools are for testing device interconnects between silicon chiplets in multi-die packages.

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EO-Y-014 hybrid flux is for wave and selective soldering.

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AuLTRA ThInForm ultra-thin precision AuSn preform is designed for semiconductor laser applications.

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