Leica INS300 fits the demands of IC manufacturers for equipment with optimized price/performance ratio.

Designed based on the field-proven INS3300 inspection and review system, successfully used in production for almost four years and takes the increased price and cost pressure in the semiconductor industry into consideration. Provides manual inspection of 300 mm wafers. Can be integrated into 300-mm facilities for complete automation of the process flow, resulting in production runs of more than 150 wafers/hr.

Leica Microsystems, www.leica-microsystems.com

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