Highly Accelerated Thermal Shock System Implemented at Major U.S. OEM
Integrated Reliability Test Systems (IRTS) Inc. announced that Rockwell Collins has purchased a Highly Accelerated Thermal Shock (HATS) System.
The system, scheduled to be installed in September, will service Rockwell Collins' in-house thermal shock testing requirements. Two HATS systems were previously installed at Intel Corp. and the Hong Kong Productivity Council last year.
The system, which has been in use by the IPC PCQR2 Database for reliability testing of via daisy-chain structures since October 2003, offers:
Built on existing air-to-air thermal shock standards (IPC-TM-650, Method 2.6.7.2B)
Reduced operating cost over dual chamber systems
Reduced cycle times by 50 to 70%
36-coupon capacity with 4 nets per coupon
Temperature cycles ranging from -60 to +160°C
20 4-wire precision resistance readings per second
Integrated Reliability Test Systems, www.hats-tester.com
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