Used for tracking semiconductor wafers through the manufacturing process, In-Sight 1721 offers a slimmer package and twice the speed of its predecessors, yet maintains mounting and functional compatibility with them.

“As fabs move toward full wafer traceability, they are more dependent than ever on reliable automated wafer identification,” said Justin Testa, Senior VP of ID Products. “This newest member of Cognex’s series of industry-leading wafer readers reads faster with higher yield under difficult real world process conditions.”

Advanced image formation technology and OCR, 2-D matrix and barcode recognition algorithms deliver reliable reading performance on SEMI-standard scribes. Said to provide high read rates on wafer marks that have been affected by CMP, edge beads, copper metallization, blue or green nitride coating and other process effects.

Offers flexible mounting options for easy installation on wafer sorters, ion implanters, probers and other tools. GUI simplifies set up, automatic tuning minimizes operator intervention. Built-in network and serial communications provide connectivity to other process tools and the fab network.

Available in September.

Cognex Corp., www.cognex.com.

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