Goepel Integrates Scanflex into Digitaltest ICT
Published: 05 October 2005
by Staff
“The result of the development cooperation is a completely integrated solution with interaction of the test resources of both systems,” said Bettina Becker, marketing and international sales manager for Goepel. “In particular, the direct control of the ICT pin electronics by the Boundary Scan environment has the advantage of each nail acting as additional virtual scan pin in a Boundary Scan test. Applying our philosophy of ‘Extended Boundary Scan’, the user now is able to dramatically increase the test coverage.”
The hardware is based on the Scanflex PCI controller models SFX/PCI1149-x with programmable TCK frequencies up to 20 MHz (A type) and 50 MHz (B type), respectively. The connection to the UUT uses transceiver model SFX-TAP4/C, which provides four programmable TAP for the optimal adaptation to the UUT. The UUT is contacted by means of the standard interface of the ICT. Also, 32 dynamic I/O are available on the hardware.
In terms of software, the complete Cascon Galaxy development and execution environment was integrated into the CITE operating system by Digitaltest via the CAPI interface. All Cascon software editions can run on the ICT.
The ICT pin electronics' control is managed with Hyscan technology implemented in the software. It enables the synchronisation of serial JTAG/Boundary Scan test vectors with parallel test vectors through a special emulation process. The parallel vectors are linked to the physical I/O interface at run time, providing tester hardware independence. The manual or automated generation of test vectors, debugging and fault diagnostic are executed by the native JTAG/Boundary Scan tools, whereby each ICT channel acts as a bi-directional Boundary Scan pin at the contacted net, completely transparent to the user.
GÖPEL electronic, goepel.com
