Dage will exhibit two of its developments in x-ray inspection and bondtesting technology at Semicon West on July 10-13. On display will be the XiDAT XD7600NT digital x-ray inspection system with a new computerized tomography (CT) option, and the enhanced 4000HS high-speed bondtester.
 
The CT option further refines the system with volumetric measurement of solder joints. CT capability is available as an option with new systems and is suited for analysis of solder interconnections such as stacked die, MEMS, package-in-package and package-on-package.
 
The Bondtester is the result of considerable research as part of a U.S. consortium and detects brittle fracture failures in the ball-to-pad interconnection of Pb-free semiconductor devices. Its capabilities have been further enhanced with digital transducer signal processing, force versus displacement (FvD) curves and fractional energy calculation.
 
Dage Precision Industries, dageinc.com.  
Semicon West Booth 7315
 

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