The Medalist SJ50 Series 3 automated optical inspection system improves ease of use, throughput, component location and supportability over the previous generation and can handle 01005 components.

Includes algorithms designed to bring greater image clarity to low-contrast components, for better defect analysis. The image clarity results in lower false-call rates and improved defect detection.

Is ergonomically advanced with significant user and system interfaces. Can be deployed in a 2-D paste, pre-reflow, mixed-mode and post-reflow environment while quickly converting the optics head for inline 3-D solder paste inspection.

Links to downstream repair stations and statistical process control.

Agilent Technologies, www.agilent.com/see/aoi.

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