The MT9928 semiconductor test handler offers up to eight parallel test sites, can test 28,000 UPH, and supports changeover between different types of device under test packages in a short time. Can test semiconductor devices in a temperature range of -55° to 175°C with up to ±2°C of temperature control accuracy. During the test, the temperature stability of devices can reach ±0.5°C. Can also sync thermal levels between DUT and the temperature cavity more quickly. For large-size components like SO300 and SO430, MT9928 reportedly provides greater test speed (2x or more) than other test handlers. Supports standard SOT, SO, MLF and TO packages from 1.2 x 2 mm to 15 x 21 mm, to 0.4 mm component pin pitch.
Multitest,
www.multitest.com
