The VK-9700 Color 3D Laser Scanning Confocal Microscope has the capabilities of SEMs and non-contact profilometry. Features are said to include 18,000x magnification and 0.001 µm precision. Performs surface profile, roughness, 3D and comparative measurements. 3D display works with the virtual trackball method and a computer mouse to control viewing angle, lighting angle, zoom level and Z-axis height. 3D images can be illuminated with pseudo-light. VK-Viewer, VK-Analyzer and VK-Assembler are available software programs. An optional adjustable stand permits measurement of objects up to 3.94". Larger stages for wafers up to 11.81", electric stages for automatic image assembly, and a separate measuring head are available.

Keyence Corp. of America, www.keyence.com

Laser cut stencils are said to deliver aperture definition and superior dimensional tolerances for pitch apertures down to 0.016". On a 600 x 600 mm area, it reportedly is possible to cut features with an aperture of ±9 µm and a positional tolerance of ±12.5 µm. Permits cutting of circular pads with a diameter of 30 to 800 µm. The LPKF MultiCut is designed for the best possible metal stencil cutting quality; permits minimum apertures of 40 µm diameter.

Fine Line Stencil, www.finelinestencil.com

The free V7.01 IPC-7351 Land Pattern Calculator is said to generate results that match the LP Viewer library documentation. Component families that have been added: aluminum electrolytic capacitors; 2-pin crystals, and land grid arrays. Is a scaled-down version of the LP Wizard. Calculates CAD library parts that comply with the latest IPC-7351 revision.

PCB Matrix Corp.,

http://www.pcblibraries.com/news/templates/news.asp?articleid=51&zoneid=3

Nonlinear vector network analyzer is for the PNA-X microwave network analyzer. Features nonlinear component characterization, nonlinear scattering X-parameters, and nonlinear pulse envelope domain capabilities. Can measure the calibrated amplitude and cross-frequency relative phase of measured spectra from 10 MHz to 26.5 GHz. Component characterization is enabled by measuring and displaying both the amplitude and phase of the full spectra in the PNA-X network analyzer. Data can be displayed in time, frequency, power or user-defined custom domains.

Agilent Technologies Inc., www.agilent.com/find/nvna