Seica Develops Thermal Scan for Aerial Flying Probe
Published: 15 March 2010
Two IC thermal detection units for the Aerial flying probe tester detect thermal parameters of ICs under power. Compare temperatures of known good boards to suspect boards, and indicate bad components. Reportedly permit precise thermal measurement of the IC or other components while the part is powered up, even under low-voltage conditions.
Seica, www.seica.com
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