NORTHBROOK, IL— A new Underwriters Laboratories white paper clarifies the theory of dielectric breakdown and the objective of the dielectric voltage withstand test, which takes place during the product design phase of electronic devices.

The Dielectric Voltage Withstand Test – Benefits and Limitations highlights the test as a way to reinforce the safety and quality of insulating materials for a broad spectrum of electrical products, while defining protocol for making sure results are properly interpreted during the product safety approval process.

In the paper, UL explains that the purpose of the dielectric voltage withstand test is to determine the minimum level of insulation needed to protect electronic device users from electric shock hazards. While testing, the process of dielectric breakdown is monitored by a current sensitive circuit, which trips-out the test equipment when the current exceeds a sensitivity setting. It also outlines investigative paths that can be taken to understand the true causes of dielectric tester trip-out.

"As technology evolves and electrical products and components get more complicated, UL is working to make sure that testing protocol meets the latest safety and performance standards," said Dale Hallerberg, research engineer in UL's Corporate Research division. "UL remains committed to helping manufacturers know how to properly use these tests and accurately interpret test results in support of product safety."

To download a copy of the paper or to learn more about related UL standards, testing and certification services, visit www.uluniversity.com/thoughtleadership.

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