MAASTRICHT, NETHERLANDS -- A European trade group has translated a new JPCA standard for designing and testing embedded devices.

JPCA-EB01, Standard on Device Embedded Substrate, 4th edition, was released at earlier this month. The 200-page document covers terminology, reliability, test and design options for embedded devices, including base devices; mounting and interconnections; fabrication; test specimens and methodology, microsectioning; conductor dimensions; environmental tests and more.

The EPIC is distributing the English version of the document at eipc.org.

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