Rome, NY -- The ESD Association's annual symposium on electrical overstress (EOS) and electrostatic discharge (ESD) will be held in Anaheim, CA, from Sept. 11-16. The EOS/ESD Symposium is a week of tutorials, technical sessions, workshops and exhibits.

Over 20 tutorials present a range of topics, including: ESD basics for program managers, ESD on-chip protection in advanced and RF technologies, air ionization, EOS/ESD failure models and mechanisms, in-plant ESD survey and evaluation measurements, and CDM design and characterization. A S20.20 seminar on developing and implementing an ESD control program is also offered.  Many tutorials earn credit for professional certification programs: ESD Certified Professional-Device/Design and ESD Certified Professional-Program Manager.

Technical sessions offer over 50 presentations from international authors. Papers address issues in categories such as on-chip RF, on-chip physics/modeling, system-level ESD, factory and materials, and on-chip CMOS.

This year's workshops include topics such as ESD control and design for extremely sensitive devices; automated equipment, ESD and grounding issues; ESD auditing; and silicon technology scaling and ESD reliability.

A featured speaker Kenneth E. Goodson, Associate Professor of Mechanical Engineering at Stanford University, will present "Advanced Thermal Modeling of Transistors" on Sept. 13.

Exhibits are open to the public and do not require symposium registration. 

The ESD Association offers discounts for association members, students and early registration (deadline is July 29). For more info: www.esda.org/symposia.html.

 

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