Owens Design Expands Family of ATE Probers
Robotic probers for the high-end semiconductor test industry can solve calibration problems facing automatic test equipment manufacturers.
These tools, which contain high speed, complex electronics, require a method to validate and calibrate their test signals. As test points have increased in number to the thousands, and chip speeds have increased in bandwidth into the GHz, robotic probing devices have automated the process under software control.
The family of robots now includes R-Theta and x-y versions for many ATE testers. The robots attach to the test head and probe specific pads on a device interface board. An on-board CPU moves the probe tip along high-precision linear bearings using optically encoded stepper motors for accurate positioning.
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