JTAG chain debugger helps reduce debug and test times for engineers designing and testing complex PCBs. Features a range of debug options which allow designers to trace signals around the board and immediately find the location of any problems within the JTAG chain. Engineers can get boards up and running quickly, rapidly diagnose faults and speed up the development process.
 
“With the addition of the chain debugger to the XJTAG system, engineers now have an ‘out-of-the-box’ solution for debugging and testing boards populated with JTAG devices,” said Dominic Plunkett, CTO. “Design engineers can now debug and test their printed circuits in hours as opposed to days/weeks with other competitive systems.”
 
In addition to the chain debugger, the XJTAG Development System has other new features to speed up board design and prototype testing. The connection test now includes built-in testing of pull-up and pull-down resistors, along with more precise fault detection. Within XJAnalyser, BSDL file auto-detection has been improved and the library of reusable JTAG scripts has been expanded. It is quicker to set up non-JTAG devices following enhancements to the Devscript utility for XJEase.
 
The Development System meets the need for testing tightly-packed PCBs populated with BG) and chip scale devices, which cannot be tested by traditional methods.
 
Designed to cut the cost and shorten the development cycle of electronic products, can test JTAG or non-JTAG devices. Can test a high proportion of a circuit including BGA and chip scale devices, SDRAMs, Ethernet controllers, video interfaces, Flash memories, FPGAs, microprocessors and other devices. Enables In-System Programming of FPGAs, CPLDs  and Flash memories.
 
XJTAG, xjtag.com

• Prev
• Next