Medalist 5DX automated x-ray inspection’s 8.4 software release reportedly contains specialized algorithms that permit inspection of quad-flat, no-lead (QFN) components with reduced false call rates; defect characterization on non-wetted direct FET (field-effect transistor) by using an open slope paste test; and a threshold enabling inspection for solder presence along side edges of capacitors.
 
Agilent Technologies, www.agilent.com

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