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Mike Buetow

CAVEAT LECTOR

For EDA, it’s back to the future.

Mike Buetow
Peter Bigelow

ROI

Data miners have much in common with manufacturers.

Peter Bigelow
Martin Wickham

DEFECTS DATABASE

Champagne voiding: The not-so-tasty treat.

Martin Wickham
Ranko Vujosevic

SMART FACTORY

Reducing labor content and defects in SMT.

Ranko Vujosevic, Ph.D.
David Bernard

TEST AND INSPECTION

CT: Time-intensive, but worth it.

David Bernard, Ph.D.
Robert Boguski

TEST AND INSPECTION

The benefits of old.

Robert Boguski
Allen Abell

GETTING LEAN

Mixed-technology designs are prime for waste elimination. Here’s how.

Allen Abell
   
Mike Buetow

CAVEAT LECTOR

Putting the pieces together.

Mike Buetow
Peter Bigelow

ROI

Before and after.

Peter Bigelow
 E. Jan Vardaman

ON THE FOREFRONT

What’s driving Japan.

E. Jan Vardaman
 Mark Finstad

The Flexperts

Assembly adjustments.

Mark Finstad
 Elvia Hinojosa

Getting Lean

Reworking repair.

Elvia Hinojosa
 Dr. Chris Hunt

Defects Database

Spitting solder.

Dr. Chris Hunt
 
 
Robert Boguski

Test and Inspection

What tests can’t tell you.

Robert Boguski
   
Mike Buetow

CAVEAT LECTOR

Designed for speed.

Mike Buetow
Peter Bigelow

ROI

The local supply chain: endangered species.

Peter Bigelow
 Thomas Smiley

FOCUS ON BUSINESS

What should boards cost?

Thomas Smiley
 Tim O'Neill

TECH TIPS

Understanding the “dot” matrix.

Timothy O’Neill
 Robert Boguski

Test and Inspection

The terrors of test.

Robert Boguski
 Jose Luis Garcia

Getting Lean

Excess of spares.

Jose Luis Garcia
Dr. Chris Hunt

Defects Database

Plugged up.

Dr. Chris Hunt
   
Mike Buetow

CAVEAT LECTOR

Ungoverned.

Mike Buetow
Peter Bigelow

ROI

Working with the next generation.

Peter Bigelow
 Thomas Smiley

FOCUS ON BUSINESS

The offshoring balance.
Thomas Smiley
 Hom-Ming Chang

Getting Lean

High-volume test.

Hom-Ming Chang
 Robert Boguski

Test and Inspection

Modeled to fail.

Robert Boguski
 Dr. Chris Hunt

Defects Database

PTH separation.
Dr. Chris Hunt
Mike Buetow

CAVEAT LECTOR

Breaking the (m)old.

Mike Buetow
Peter Bigelow

ROI

Trying harder.

Peter Bigelow
 Joseph Fama

FOCUS ON BUSINESS

Dealing with protectionism.
Joseph Fama
 Timothy O'Neill

Tech Tips

Particle size vs. nanocoatings.

Timothy O’Neill
 Robert Boguski

Test and Inspection

Beware the time wasters.

Robert Boguski
 Curtis Campbell

Getting Lean

Integrating with the design team.

Curtis Campbell
 Dr. Chris Hunt

Defects Database

Robotic soldering.
Dr. Chris Hunt
   
Mike Buetow

CAVEAT LECTOR

Plugging the leaks.

Mike Buetow
Peter Bigelow

ROI

Cybersecurity is all fogged up.

Peter Bigelow
 Mike Buetow

FOCUS ON BUSINESS

Making sense of the Philippines.
Mike Buetow
 Greg Papandrew

GLOBAL SOURCING

Where the supply chain begins.

Greg Papandrew
 Timothy O'Neill

TECH TIPS

Getting to the bottom of void problems on QFNs.

Timothy O’Neill
 Dennis Mcnamara

GETTING LEAN

Shedding light on wastes in LED assembly.

Dennis McNamara and Yousef Heidari
 Robert Boguski

TEST AND INSPECTION

Investing in the future of test.

Robert Boguski
 Martin Wickman

DEFECTS DATABASE

Spitting it out.
Martin Wickham

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