News
PHOENIX – EMS provider Suntron Corp. announced
today that its majority shareholder, Thayer-Blum Funding, intends to take the
company private, subject to completion of financing. The deal is expected to
close in December.
ANGLETON, TX – Benchmark Electronics lowered
its third-quarter guidance by $50 million to $100 million due to slower than
anticipated product and program transitions, and softer demand.
SAN JOSE – The MicroElectronics
Packaging and Test Engineering Council announced its technical symposium
Substrates: The Foundation of Semiconductor Packaging, to be held in San Jose
Nov. 8.
The objective of this symposium is to identify technology requirements for the next generation of substrate technology, highlighting required innovations that will further enable IC component integration, and electronic system functionality.
The program is segmented into the following areas: Substrate Manufacturing and 1st Level Interconnect Technology; Design and Simulation: Silicon, Substrate, System; 2nd Level Interconnect and Reliability, and Emerging Substrate Technologies.
For more information, visit www.meptec.org.
The objective of this symposium is to identify technology requirements for the next generation of substrate technology, highlighting required innovations that will further enable IC component integration, and electronic system functionality.
The program is segmented into the following areas: Substrate Manufacturing and 1st Level Interconnect Technology; Design and Simulation: Silicon, Substrate, System; 2nd Level Interconnect and Reliability, and Emerging Substrate Technologies.
For more information, visit www.meptec.org.
Press Releases
- Pushed by glass core and high-end ICs substrates for AI, the advanced IC substrate market reaches $31 billion by 2030
- Pushed by glass core and high-end ICs substrates for AI, the advanced IC substrate market reaches $31 billion by 2030
- Ryder Vietnam - Phase 2: Building resilience and meeting demand
- Scanfil and Etteplan deepen their strategic partnership into production testing