News
Rome, NY – The ESD Association’s annual symposium focused on electrical overstress (EOS) and electrostatic discharge (ESD) will be held in Tucson, AZ, on Sept. 10-15.
The EOS/ESD Symposium is a week of tutorials, technical sessions, workshops and exhibits. For individuals interested in professional certification and general education, over 20 tutorials cover ESD basics for program manager, ESD on-chip protection in advanced and RF technologies, air ionization, EOS/ESD failure models and mechanisms, in-plant ESD survey and evaluation measurements, CDM design and characterization, and more. Also offered is the two-day S20.20 seminar on developing and implementing and ESD control program.
This year’s technical sessions offer over 50 presentations from international authors. Papers address issues such as on-chip RF, on-chip physics/modeling, system level ESD, factory and materials, and on-chip CMOS.
This year’s symposium offers two extra workshops which will begin on Tuesday evening followed by the normal set of workshops on Wednesday afternoon. Some workshop topics include: ESD control and design for sensitive devices; CDM at the nanoscale frontier; ESD auditing; and layout for ESD and latch-up robustness.
Authors’ Corners provide access to technical paper authors for discussion.
A featured plenary speaker Win Maung, senior member of technical staff at Texas Instruments will present “Consumer Connectivity Solutions” on September 12.
Many of the tutorials earn credit for one of the professional certification programs sponsored by the ESD Association: ESD Certified Professional-Device/Design and ESD Certified Professional-Program Manager. The ESD Certified Professional-Program Manager exam will be held in Anaheim and is open to individuals who meet the requirements set out by the ESD Association, including prior registration with association headquarters. The association has also extended an offer to certified NARTE engineers who wish to earn Program Manager certification (for details visit www.esda.org/certification.html).
Exhibits are open to the public and do not require symposium registration.
Other events include the Welcome Reception, Awards Breakfast, Professional and Technical Women’s Reception, Attendee Lunch, and the ESD Association Annual Meeting and Luncheon.
For symposium information visit esda.org/symposia.html.
The EOS/ESD Symposium is a week of tutorials, technical sessions, workshops and exhibits. For individuals interested in professional certification and general education, over 20 tutorials cover ESD basics for program manager, ESD on-chip protection in advanced and RF technologies, air ionization, EOS/ESD failure models and mechanisms, in-plant ESD survey and evaluation measurements, CDM design and characterization, and more. Also offered is the two-day S20.20 seminar on developing and implementing and ESD control program.
This year’s technical sessions offer over 50 presentations from international authors. Papers address issues such as on-chip RF, on-chip physics/modeling, system level ESD, factory and materials, and on-chip CMOS.
This year’s symposium offers two extra workshops which will begin on Tuesday evening followed by the normal set of workshops on Wednesday afternoon. Some workshop topics include: ESD control and design for sensitive devices; CDM at the nanoscale frontier; ESD auditing; and layout for ESD and latch-up robustness.
Authors’ Corners provide access to technical paper authors for discussion.
A featured plenary speaker Win Maung, senior member of technical staff at Texas Instruments will present “Consumer Connectivity Solutions” on September 12.
Many of the tutorials earn credit for one of the professional certification programs sponsored by the ESD Association: ESD Certified Professional-Device/Design and ESD Certified Professional-Program Manager. The ESD Certified Professional-Program Manager exam will be held in Anaheim and is open to individuals who meet the requirements set out by the ESD Association, including prior registration with association headquarters. The association has also extended an offer to certified NARTE engineers who wish to earn Program Manager certification (for details visit www.esda.org/certification.html).
Exhibits are open to the public and do not require symposium registration.
Other events include the Welcome Reception, Awards Breakfast, Professional and Technical Women’s Reception, Attendee Lunch, and the ESD Association Annual Meeting and Luncheon.
For symposium information visit esda.org/symposia.html.
Jersey City, NJ – Cookson Electronics Assembly Materials’ ALPHA Vaculoy SACX lead-free wave solder alloy has been approved for use by LG Electronics DS Division (CD-ROM).
Gerry Campbell, a Cookson global product manager, noted that “As leading OEM companies such as LG continue to drive the reduction in the total cost of their lead-free assemblies, we see a continuation of the trend of customers moving away from SAC305 to SACX.”
Gerry Campbell, a Cookson global product manager, noted that “As leading OEM companies such as LG continue to drive the reduction in the total cost of their lead-free assemblies, we see a continuation of the trend of customers moving away from SAC305 to SACX.”
ANGLETON, TX – Benchmark Electronics, a top EMS firm, expects revenues and earnings per share to exceed the high end of guidance for its fiscal second quarter.
The company in April guided for quarterly revenue of $630 million to $660 million.
The company is finalizing its financial closing for the second quarter ended June 30. Results for the second quarter will be announced July 20.
The company is finalizing its financial closing for the second quarter ended June 30. Results for the second quarter will be announced July 20.
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