Products
YTX-3000 HXR x-ray inspection system for extremely high-resolution applications features an open-tube transmission target x-ray source with an integral high-voltage power supply and computer-controlled operation. Resolves sub-micron features with zoom magnifications up to 2400x. Is designed for minimum maintenance, with an easily replaceable filament and target assembly.
Available with a four or five axes sample manipulator and a 15 x 20" (380 x 500 mm) x-y travel for samples up to 5 pounds. Full 360° rotation and 30° of tilt are available. Computer-controlled motor drives provide a rage of motion from ultra-slow use at high magnifications, to high speed for travel over large distances. Comes with a unique control module and programmable motion for automated inspection.
YESTech, yestechinc.com
Available with a four or five axes sample manipulator and a 15 x 20" (380 x 500 mm) x-y travel for samples up to 5 pounds. Full 360° rotation and 30° of tilt are available. Computer-controlled motor drives provide a rage of motion from ultra-slow use at high magnifications, to high speed for travel over large distances. Comes with a unique control module and programmable motion for automated inspection.
YESTech, yestechinc.com
Touch 1 Ultra combines the Signature Touch 1 cable tester with the Associated Research Hypot Ultra lll Hipot tester into a system capable of testing assemblies of up to 256 points at voltages to 2800VDC and 2000VAC.
Ideal for cables, connectors, flex circuits and other interconnect devices that must be tested at high voltage, offers I.R. testing to 50GW and DWV thresholds from .1mA to 1.5mA (real) and 30mA (total) current.
Has menu-driven touch screen, can self-learn from a sample wiring assembly and can programmed via the onboard editor or an imported program.
Uses new HVI (High Voltage Interconnect) interface scheme. The 4 column x 28 row test block allows you to build individual interface cables, or HVI Plugs, in four-pin increments, i.e. 4 pin, 8 pin, 12 pin, etc.
Cirris Systems Corp., cirris.com
Ideal for cables, connectors, flex circuits and other interconnect devices that must be tested at high voltage, offers I.R. testing to 50GW and DWV thresholds from .1mA to 1.5mA (real) and 30mA (total) current.
Has menu-driven touch screen, can self-learn from a sample wiring assembly and can programmed via the onboard editor or an imported program.
Uses new HVI (High Voltage Interconnect) interface scheme. The 4 column x 28 row test block allows you to build individual interface cables, or HVI Plugs, in four-pin increments, i.e. 4 pin, 8 pin, 12 pin, etc.
Cirris Systems Corp., cirris.com
A new module in the boundary scan hardware platform Scanflex, SFX1149.4, provides resources for the test of analog circuits based on the IEEE Std. 1149.4.
“We have discussed the subject of 1149.4 frequently at technology events such as our worldwide Boundary Scan Days. This has enabled us now to introduce the first JTAG/Boundary Scan benchtop system for dot1/dot4 mixed-signal applications, just in time to support customer projects entering the prototyping stage,” said Thomas Wenzel, director of the business unit boundary scan.
The module provides one complete dot4 test bus (AT1, AT2) and can be plugged directly onto an SFX TAP transceiver. To support applications with multiple dot4 test busses, several modules can be integrated in a SFX-Carrier. The module provides advanced functions for R, L and C measurements, and the generation and measurement of AC and DC signals with programmability in voltage, current and frequency. Provides a ramp function coupled with a programmable digitizer to digitally record response signals.
Is fully supported in software System Cascon v. 4.3, including the automated recognition of the instrument through the AutoDetect feature. The Cascon Application Programming Interface (CAPI) enables integration in other test systems, also providing access to the dot4 functions and measurements from external control software.
GÖPEL electronic, goepel.com
“We have discussed the subject of 1149.4 frequently at technology events such as our worldwide Boundary Scan Days. This has enabled us now to introduce the first JTAG/Boundary Scan benchtop system for dot1/dot4 mixed-signal applications, just in time to support customer projects entering the prototyping stage,” said Thomas Wenzel, director of the business unit boundary scan.
The module provides one complete dot4 test bus (AT1, AT2) and can be plugged directly onto an SFX TAP transceiver. To support applications with multiple dot4 test busses, several modules can be integrated in a SFX-Carrier. The module provides advanced functions for R, L and C measurements, and the generation and measurement of AC and DC signals with programmability in voltage, current and frequency. Provides a ramp function coupled with a programmable digitizer to digitally record response signals.
Is fully supported in software System Cascon v. 4.3, including the automated recognition of the instrument through the AutoDetect feature. The Cascon Application Programming Interface (CAPI) enables integration in other test systems, also providing access to the dot4 functions and measurements from external control software.
GÖPEL electronic, goepel.com
Press Releases
- NEPCON ASIA 2025: Innovating Smart Manufacturing Ecosystems and Bridging Global Opportunities
- Viasion Technology Expands Global Reach as a Trusted PCB Manufacturer and EMS Provider in China
- Viasion Technology Expands Global Reach as a Trusted PCB Manufacturer and EMS Provider in China
- Nordson Test & Inspection Expands Partnership with Distributor smartTec Nordic A/S