VJ Electronix Premiers X1550 X-ray System
Published: 19 September 2005
by Staff
Designed for the manufacturing floor, features large board x-ray inspection with automated motion control, measurement and analysis. Includes advanced solid-state detector-based inspection for lead-free assembly, choice of Image Intensifier and CMOS-based high-resolution detectors, full programmability with integrated motion control and image measurement analysis, and simple set up of program using 1-2-GO Interface. Low maintenance, requires minimum operator intervention.
Is part of the 15XX Series, which is built around a choice of x-ray sources from 80 to 130 kV. 1550 offers a 130 kV x-ray source, with a continuously variable field of view (up to 1.8" with zoom).
Easy to learn, use and maintain. Provides: large-board handling area (18 x 24"), magnification 700X, low-maintenance, high MTBF, fully integrated compact system and image archiving in popular file formats.
The simple set up program using 1-2-GO interface allows users to characterize the entire process with one simple solution. Onscreen representation of boards for easy maneuvering allows for maximum productivity and quality assurance based on instant and accurate information.
Incorporates key innovations necessary for high-resolution x-ray microscopy:
· A revolutionary manipulator design that provides fast, accurate, repeatable sample positioning.
· The Nexus 300 software with 1-2-GO interface and onscreen sample representation for easy maneuverability
· CMOS-based 12 bit solid-state detectors for high-contrast resolution x-ray inspection.
Comes with an advanced image processor and a complete library of measurement and analysis tools. Proprietary New ElectroniX User Software (NEXUS) is used to enhance, analyze and view real-time x-ray images. The software comes with: advanced 1-2-GO based operator interface for easy programming in minutes; automated BGA analysis module (# of balls, void size, # of voids, ball size, pitch and circularity); percent void measurement module (user definable pass/fail thresholds); onscreen representation of sample; drill offset measurement module (deviation measurements, etc.); dimensional measurement module; wire sweep measurement module; quad-view display; Advanced Defect Enhancement module; histogram analysis tools (gray-level analysis); image filtering (3-D rendering, sharpen, relief, etc.) ; and pseudo color pallet manipulation.
VJ Electronix, vjelectronix.com
