The Di-Series family of C‑size VXI-based digital test instruments builds upon the M9‑Series by increasing performance and adding key new features for emerging applications. Features highly configurable, independently programmed channels to address a test requirements from board through subassembly test.
 
Four key attributes:
Compatibility with the M9-Series and other instruments is preserved ;
Flexibility is well suited to the highest levels of assembly, such as box-level LRU (Line Replaceable Units) or WRA (Weapons Replaceable Assemblies). In addition, Di-Series cards can be partitioned to form multiple autonomous “virtual” instruments, each of which can simultaneously address different portions of the test problem while interacting with the UUT;
Performance enhancements include the ability to directly test differential logic, including high-speed LVDS (Low Voltage Differential Signaling).
Usability is enhanced by the per-channel programming of signal timing and levels and by  iStudio development and debugging software. 
 
Teradyne, teradyne.com

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