New packaging and labels are available for DMP6-10, DMP8-10 and DMP16-10 inserts. Packaging provides enhanced protection of the DMP inserts during shipping and handling. Prevents contaminants from coming in contact with DMP insert assemblies during storage. Each package has two labels, one affixed to the box and one attached to the inside bag. Labels contain part numbers, descriptions and lot numbers for tracking purposes.

Techcon Systems, www.techconsystems.com

Micro-Coil Spring Array is an alternative to standard rigid arrays. Designed to replace column grid array (solder columns) commonly used on ICs with high lead counts. Is a drop-in replacement for BGA column grid array packaging applications that require greater reliability and long-term robustness. Developed by NASA.

STI Electronics Inc., www.stielectronicsinc.com

I-prober 520 positional current probe observes and measures current in printed circuit board and other conductors without the need to break or surround the conductor. Used with an oscilloscope, this compact, handheld probe provides a bandwidth of DC to 5 MHz and a dynamic range of 10 mA to 20 A pk-pk. When user places insulated tip onto the conductor, the current flowing in the track can be observed and measured. Operates by sensing the field in close proximity to the track. Employs miniaturized version of a fluxgate magnetometer. Has a safety rating of CAT II, 300 V (CAT I, 600 V) and is suitable for connection to any 1-MΩ input of an oscilloscope. Comes with control box and calibrator, power supply, and a clip-on toroid assembly.

Aim-TTi, www.tti-test.com/products-tti/precision/iprober520.htm

ScanExpress boundary-scan tool suite v. 7.6 CD includes JTAG embedded test support for AMD Family 10 processors; enables processor emulation-based testing capabilities on AMD ASB2 (BGA), Opteron 4100, and Quad-Core Opteron CPUs. Integrates with National Instruments’ high-speed digital I/O (HSDIO) hardware. Supports 655x series of digital instruments with JTAG test clock (TCK) rates of up to 30 MHz. Other improvements include new test scripting functions and features, including direct JTAG scan functions, global script variables, and test time stamping; new pin direction constraints for TPG’s test vector generator; overhauled topology viewer, including a visual representation of all components on the scan chain, including series resistors, and test connectors; support for Blackhawk XDS560v2 series JTAG controllers, and JTAG embedded test support for Freescale i.MX51 and Texas Instruments’ AM/DM37x processors.

Corelis, www.corelis.com/education/JTAG_Boundary-Scan_Seminars_and_Training.htm

Metallograph SSC electrically conductive screen ink features a silver alternative. Is for several printed electronics applications, including membrane switches, flexible circuits, displays, and electroluminescent lighting. Delivers low cure time and low cure temperatures.

IIMAK, visit www.iimak.com

Ellsworth Packaging Advantage is a protective packaging system for all containers prone to damage during normal shipping and handling. Is now standard for all applicable chemical systems at no extra charge. Ensures shipped chemical products remain inside container. Features include corrugated cardboard boxes, custom-fitted PK foam inserts that insulate containers inside the box, and recyclable paper padding.

Ellsworth Adhesives, www.ellsworth.com

FumeSafe fume extractor limits exposure to hazardous solder fumes; extracts solder fumes from the tips of up to 15 soldering irons without cooling the tips. Is made from stainless steel and has an auto-sensing dual voltage blower (230V to 120V). Activated carbon filter is used to remove harmful gases from the solder flux fumes, along with a sub-micronic (HEPA) filter, which removes 99.997% of particles down to 0.3 µm before clean air is returned to the workplace. Features speed control, simple installation, filter blocked alarm and LED, and quick change pre-filters.

Purex International, www.purex.co.uk

QM1000 has four sites for testing analog and mixed signal Mosfets, JFETs, IGBTs, diodes, mixed signal ICs, and discrete analog devices. Designed to mate with and expand the capabilities of the LTX-Credence ASL1000; performs DC and specialty AC tests, including QG, RG, CG, and UIL/UIS (Avalanche). Offers up to 4x improvement in test throughput and yield, and is compatible with film frame, rotary, and auto handlers.

BEST Electronics and Components Co. Inc., www.becci-usea.com/dev/bestnew/services/qm1000/  

MUST camera system, for MUST III solderability testers, enhances small component alignment and inspection. Provides high magnification and a precision view of part-to-solder alignment; enables monitoring of solderability testing process. Includes 1/3" CMOS color camera with 3.3x MP macro zoom lens. Features include up to 744 x 480 pixel resolution; up to 150 FPS; color to mono switching; and close-up viewing of micro components. Is retrofittable to any existing MUST system. Captures live images into various formats; captures a timed sequence of images at set intervals; zooms from 10% to 200%, rotates images, and enables AVI recording for a defined period.

GEN3 Systems, www.gen3systems.com

MUST camera system, for MUST III solderability testers, enhances small component alignment and inspection. Provides high magnification and a precision view of part-to-solder alignment; enables monitoring of solderability testing process. Includes 1/3" CMOS color camera with 3.3x MP macro zoom lens. Features include up to 744 x 480 pixel resolution; up to 150 FPS; color to mono switching; and close-up viewing of micro components. Is retrofittable to any existing MUST system. Captures live images into various formats; captures a timed sequence of images at set intervals; zooms from 10% to 200%, rotates images, and enables AVI recording for a defined period.

GEN3 Systems, www.gen3systems.com

RED-E-SET XL series are large panel supports from 24" to 60". Are used in the ML and GO! models. Reportedly reduce changeover times, improve quality, and eliminate component damage.

Production Solutions, www.production-solutions.com

Two PXI5396-DT/x JTAG digital I/O modules on PXI bus basis support structural JTAG/boundary scan tests and I/O operations up to 100MHz for functional test executions. Feature impedance-controlled VPC interface for direct coupling to signal-critical load boards or other verification environments. Can use one test hardware for both laboratory verification and in the production line with fixture-based systems. Are based on a two-component solution, consisting of a PXI-supported interface module and an offset desktop module. Separation of the modules can be up to 2m without loss of performance. Desktop module is equipped with front connector that permits the module to be connected directly to the test environment. Two variants are available that differ in the on-board memory depth of 72MB with the PXI 5396-DT and 144MB with the PXI 5396-DT/XM. Both variants provide 96 single-ended channels, configurable as input, output and tri-state. Signals are processed synchronously to the test bus operations in the JTAG mode. Dynamic I/O mode permits functional testing with programmable clock rates within the range of 500Hz to 100MHz. Include VarioCore technology.

Goepel electronic, www.goepel.com