Circuits Assembly Online Magazine

	CAVEAT LECTOR Over inspection? Mike Buetow		ROI Treasure hunt. Peter Bigelow
	ON THE FOREFRONT Nepcon Japan: The marriage of ASICs and memory. Jan Vardaman		Tech Tips The right to profile. Timothy O’Neill
	Defects Database The finish effect on wicking.finishThe finish effect on wicking. Martin Wickham		TEST AND INSPECTION BGA void analysis. David Bernard, Ph.D.
	TEST AND INSPECTION Call of duty. Robert Boguski		GETTING LEAN Taking test offline. Hom-Ming Chang