Accurately locating and treating static-related problems at the source can increase product quality, output and yields. FMX-003 Fieldmeter is a measuring tool to isolate and solve static problems in applications with a potential for static charge generation.

Measures static voltages within ±22kV (22,000V) at a distance of 1" and displays results numerically and in bar graph format. POWER on/off, ZERO adjustment, Ion Balance (IB) and HOLD are all push button operations. HOLD button allows the display to retain the static charge reading, useful when the display is difficult to see during measurement.

Simco, simco-static.com

NITON XLi 300 is a “phaser grip” ergonometric option in portable lead analyzers.

Said to provide fast, accurate lead analysis for inspections, risk assessment and screening with portability, ease of use and advanced reporting and data integration tools. Enhances inspector productivity - providing dependable results in seconds – even at or near action levels.

Features an integrated touch-screen display, intuitive user interface along with multiple data entry options and optional BlueTooth wireless communication. Extend-a-Pole option allows anyone to reach ceilings and high trim.

Offers features like tamper-proof data encryption, analysis of both the “K” and “L” shells and an ability to handle dense substrates or deeply buried paint.

Has weather-resistant design, splash-proof housing and a backlit screen that can be read in bright sunlight, even while wearing sunglasses.

Thermo Electron, thermo.com/NITON

SFX/USL1149-x Scanflex Boundary Scan controller supports USB2.0 and 10/100 MBit Ethernet interfaces and is offered in performance classes A, B and C.

The models differ in the upper TCK frequency limit (maximum of 20, 50 or 80 MHz, respectively) as well as the implementation level of the enhanced Space II chip set for high performance scan operations. Integrated Fastscale technology allows an upgrade of the controller’s performance class on the fly. Include Adycs II to compensate run time delays and Hyscan for splitting of serial TAP vectors and parallel I/O vectors.

In combination with SFX transceiver and I/O modules, USB2.0 and LAN controlled Boundary Scan systems with up to eight concurrent TAP and 31 additional functional modules can be configured. All TAP provide programmable input and output voltage, input and output impedance, TCK frequency and delay compensation, as well as read-back of output signals and a relay-controlled power signal.

Supported by System Cascon from version 4.2.1 on.

GÖPEL electronic, goepel.com

Agilent Technologies Inc. announced that IDT (Integrated Device Technology Inc.), a communications IC company, has purchased eight Agilent BIST Assist production test cards to upgrade its 93000 Series SOC Tester. The upgrade allows testing of high-speed links in loopback/BIST mode for speeds up to 6.4 Gb/s.

Historically, as interface bandwidths in consumer devices such as televisions, set-top boxes and PCs increase, the cost of test rises exponentially. Manufacturers are also encountering consumer-pricing pressures. Agilent created the Built-in Self-Test Assist (BIST) card to break the trend of escalating costs for high-speed links in production and to act as an extension to the SOC tester. 

The card features adjustable and precise jitter injection, DC access and at-speed level control. Said to have a flexible and wide application span for graphics, chipset, switches and SerDes devices in BIST or loopback mode (SATA, AMB, PCI Express and Fibre Channel, for example) that require high-fault coverage and high-speed data rates.   

Agilent Technologies Inc., agilent.com/see/soctest