Agilent TS-8900 automotive functional test system is a standardized PXI-based solution for testing medium- to high-pin-count electronic control units. Provides up to 20% better throughput compared with earlier Agilent automotive functional tester. Has simultaneous measurement channel capabilities. Includes 32-channel M9216A high-voltage data acquisition module. Capable of acquiring voltage levels ranging from 1 mV to 100 V at 250kSa/s per channel simultaneously. Provides direct connectivity to ECUs without the need for external front-end signal conditioning circuitry. Comes with a suite of more than 200 built-in applications-tuned test libraries.

Agilent Technologies, www.agilent.com

Model 2651A SourceMeter instrument reportedly provides the widest current range available for testing high brightness LEDs, power semiconductors, DC-DC converters, batteries, and other high power materials, components, modules and subassemblies. Offers a four-quadrant voltage and current source/load coupled with precision voltage and current meters. Combines functionality of multiple instruments in a single full-rack enclosure: semiconductor characterization instrument, precision power supply, current source, DMM, arbitrary waveform generator, V or I pulse generator, electronic load and trigger controller. Is expandable into a multi-channel synchronized system via TSP-Link technology. Can source or sink up to 2,000W of pulsed power (±40V, ±50A) or 200W of DC power (±10V@±20A, ±20V@±10A, ±40V@±5A). Measures signals as low as 1pA and 100 mV at speeds up to one microsec. per reading. Provides a choice of digitizing or integrating measurement modes for characterization of transient and steady-state behavior. TSP Express LXI-based I-V test software is embedded.

Keithley Instruments, www.keithley.com