Seika Machinery, www.seikausa.com
NL930 Pb-free, no-clean solder paste is said to feature good solderability, improve stencil life and provide superior cosmetics, especially when using SN100C. Offers print consistency with high process capability index and wetting characteristics. Post-reflow flux residues are penetrable. Is compatible with SN100C and SAC alloys with Type 3, 4 and 5 solder meshes, and with OSP, ENIG, immersion silver, and immersion tin finishes. Features high-volume repeatability with 16 mm pitch QFP pads and 12 mm circles, as well as good response to one-hour pause after two knead strokes at 35-65% RH.
FCT Assembly, www.fctassembly.com
Silver Zebra elastomeric connector is for most electronics packages. Uses a component-to-board or board-to-board design. Offers a current carrying capacity up to 0.700 A per square 0.040"; exhibits a contact resistance of less than 0.50 Ω. Creates redundant electrical contact; incorporates 240 alternating layers of silver-filled conductive elastomer and nonconductive silicone material per inch of connector. Provides a centerline pitch between layers of 0.004" and permits 0.015" pad spacing on the PCB. Is also available with an outer installation barrier.
Fujipoly America, www.fujipoly.com
QX500 AOI has improved cycle times. Now includes SIM, enabling on-the-fly inspection.
SE500-X 3-D solder paste inspection now accommodates boards/panels measuring 100 x 100 mm up to 810 x 610 mm. SE500 and SE500-X 3-D can inspect pad sizes down to 01005.
CyberOptics Corp., www.cyberoptics.com
Extended Reach substrate handling tips are for solar cells, wafers or flat panels. Come in three sizes for reaching up to 200 mm into an area to pick up a substrate. Substrates handled can range from 4" to more than 12". Can be used with any of the firm’s wafer wands. Handle temperatures up to 212°F.
Virtual Industries Inc., www.virtual-ii.com
FlyScan integrates boundary scan and flying probe test methods. Comes on the Pilot/Aerial flying probe testers. Features automatic generation of the test program in a single software environment (Seica VIVA); automatic creation of the boundary scan program for nets not of the JTAG type; automatic elimination of test redundancies; automatic fault diagnostics; a single test report, and management of the faults detected by the boundary scan test in Seica Repair Station.
Seica, www.seica.com