Circuits Assembly Online Magazine - Features

RFID Smart Feeder validation system is reportedly robust and flexible enough for all machine types. Can be retrofitted to existing placement machines. Enables closed-loop feeder and component setup validation; eliminates human errors and reduces changeover time; provides real-time material inventory, traceability and feeder slot scans.

Integrates with feeder setup verification software from third-party suppliers to eliminate manual barcode scanning.

Cogiscan, cogiscan.com

1072 VOC-Free rosin flux is both halide- and VOC-free. The new chemistry combines the benefits of rosin with the environmentally friendliness of a water-based product.

Specifically developed for wave soldering of surface-mount, mixed-technology and through-hole electronic assemblies. Water-based nonflammable formulation eliminates special storage requirements. Said to offer solderability on difficult-to-solder assemblies and a wide process window.

Indium Corp. of America, indium.com

PALO ALTO and MOUNTAIN VIEW, CA, Dec. 14, 2004 -- Agilent Technologies Inc. and Synopsys Inc. have introduced a scan diagnostics reference methodology that speeds fault localization and failure analysis for semiconductor design and test engineers, the result of a three-year strategic alliance.

The methodology is enabled by the Agilent 93000 SmarTest Program Generator (PG) 2.2 and the Synopsys TetraMAX automatic test pattern generation (ATPG) solution, in conjunction with the Agilent 93000 SOC Series test platform. The tools automate the bidirectional information sharing between electronic design automation (EDA) and automatic test equipment (ATE) required for scan diagnostics.

As process geometries shrink and device complexity grows, identifying device failures becomes increasingly difficult. The demand for shorter time to market and lower product cost makes rapid diagnostics and fault localization vital during the first silicon evaluation and production ramp up. EDA companies have begun to offer fault localization tools, but they require failure information from automatic test equipment. Until now, a standardized and supported means for sharing information from ATE has not been available.

The SmarTest PG 2.2 offers a transition from the EDA environment to the capabilities of the 93000 SOC Series, which speeds test development for functional and scan tests. SmarTest PG 2.2 provides a scan failure map on the SOC Series in their native scan context, speeding first silicon debug. Features a simplified user interface and command-line operation, and supports industry-standard EDA input formats, including Standard Test Interface Language (STIL), Waveform Generation Language (WGL), Value Change Dump (VCD), Extended VCD (EVCD) and Core Test Language (CTL).

MIXPAC S-50 System for two-component adhesive dispensing works with manually operated dispensers from ConProTec, as well as with a new patented, battery-powered EZ-mix HI hand-held dispensing unit by DTIC Dispensing Technologies.

When used together, the systems obtain a higher flow rate and dispense thicker materials safely. The S-50 can accommodate volumetric ratios of 1:1, 2:1, 4:1, 10:1 and 3:2.

ConProTec Inc., conprotec.com

Designed to test microelectronic devices, MEMS, photonic and other small components, the 5848 MicroTester provides precise load and displacement measurement capability and claims an excellent cyclic performance.

Applications include semiconductor die shear and pull tests, tensile testing of fine wires, flex testing of circuit boards and substrates, and peel tests of thin films and substrates. Load capacity of 2 kN, provides sub-micron position measurement accuracy and ultra high-precision load and position control for static testing of micro-components and cyclic fatigue testing.

Includes an extremely rigid frame, for horizontal or vertical orientations, and an encoder mounted directly on the loading actuator for position measurement resolution of better than 20 nanometers.

Instron, instron.com

AlSiC (Aluminum Silicon Carbide) metal matrix composite for optoelectronic housings and lids enables a tailored coefficient of thermal expansion (CTE), offering compatibility with various electronic devices and assemblies. Unlike traditional housing materials, the isotropic CTE value of AlSiC can be adjusted for specific applications by modifying the Al-metal/SiC-particulate ratio. CTE matching capabilities ensure alignment and precision.

Exhibits high thermal conductivity for thermal dissipation, prevents bowing and flexing of packaging and substrate material that can lead to failure. Traditional housing materials with lower thermal dissipation can cause delamination, leading to air gaps and poor reliability.

The near and net-shape fabrication process produces the composite material and fabricates the product geometry, allowing rapid prototyping for high-volume thermal management solutions. Unrestricted geometry enables the inclusion of design features such as septums, walls and radial features. Casting process allows integration of high thermal conductivity inserts (>1000 W/mK) or cooling tubes.

CPS Corp., alsic.com