Built in rugged stainless steel and fully rated for product washdown, the Stainless Steel Conveyor meets the needs of food, beverage, and consumer goods manufacturers.
Has side frames built in 304 polished stainless steel; all fabricated parts available in stainless steel. Can be wet-cleaned after production runs. Corrosion-resistant construction reduces wear and tear and extends conveyor component life.
Expands on the company's rollerless conveying system, offering styles for zero-pressure accumulation, transportation, incline, decline and metering. Uses a modular plastic-belt conveying surface, eliminating the need for rollers and providing a continuous surface for product conveying. The belted surface also decreases the number of moving parts, simplifying maintenance, installation and start-up.
Operates at speeds up to 300 ft/min., has a live load weight capacity of 70 lb./ft and can convey a variety of items, from shrink-wrapped packages to corrugated boxes.
FKI Logistex, fkilogistex.com
T612M-DS double-sided thermal transfer printer can simultaneously print on the front and back of the marker. Offerscost savings through halved print time and reduced waste.
Can process all TMS SYSTEM SIX heat-shrinkable markers, from 2.4 to 57.2 mm.
Rated for heavy-duty cycles, incorporates a 300-dpi (12-dpmm) print head. The printer-marker system is also suitable for general-purpose, high-volume industrial use.
The data printed onto the two sides of each marker can be identical, different, same-side up or flipped. Offers nominal print speeds of 50 to 128 mm/second and is available in English, French, German, Italian or Spanish language configurations.
Tyco Electronics, tycoelectronics.com
The In-Sight 5100C color vision sensor performs a range of color inspection tasks in a number of major industries. Can be used in the electronics industry to verify the correct position of color LEDs at electrical test stations. In-Sight 5101 is a high-resolution (1024 x 768) industrial-grade vision sensor for high-accuracy gauging applications that require increased resolution for inspecting small objects, or capturing images of larger parts.
The self-contained vision sensors meet IEC specifications for shock and vibration, and achieve an IP67 (NEMA 6) rating for dust and wash-down protection - without the need for a separate industrial enclosure. Include vision spreadsheet interface and software to simplify application development and network administration.
Cognex Corp., cognex.com
The DEK Instinctiv user interface acts as the portal to technical support services via the Internet and is now available on the Micron-class Galaxy and Europa platforms.
The UI draws on human factors techniques to display complex machine and process data in an easily digestible form. Features advanced graphical techniques, real-time indication of consumables levels and extensive on-board help and error recovery.
Using wireless broadband connectivity across the shop floor, combined with up to the minute security features including Internet firewall and Wireless Encryption Protocol (WEP), Micron-class machines can now be connected to DEK knowledge servers via IPsec VPN tunnel technology without requiring extra cabling.
PALO ALTO, CA-- Agilent Technologies Inc. (agilent.com) has developed bead probe methodology for in-circuit test of high-speed and high-density printed circuit boards (PCBs). Bead probe technology addresses the needs of electronics contract manufacturers for accurate testing of increasingly complex PCBs, such as those used in communications and computing.
As board circuitry gets smaller, traditional bed-of-nails test solutions become problematic. Because on-board test target sizes are shrinking, this approach is no longer capable of reliably contacting hyper-small test targets, which have an unacceptable performance impact on high-frequency signals. Likewise, boundary-scan cannot solve this problem because it does not offer 100% coverage of defects.
Bead probe technology circumvents these issues by placing very small, hemi-ellipsoid beads of solder directly onto a board's copper traces. A bead probe, only a few mils tall, protrudes above the solder mask. When partially flattened by a fixture-based, flat-faced target probe, it gives low-contact resistance needed for testing.
Bead probes are easily fabricated, using the same steps as solder masking/stenciling.
"Bead probes are particularly well suited for highly dense layouts or gigabit signals and, according to our tests, have a negligible impact on circuit performance during normal operation," said Kenneth Parker, engineer/scientist for Agilent's Electronic Manufacturing Test Division. "Bead probes let us approach an ideal of layout-independent, test-point placement -- a great benefit in high-density, high-frequency design that will revolutionize the normally adversarial relationship between board designers and test engineers."
Currently being tested by Agilent's high-volume manufacturing partner, full licensing of the technology is expected to be available by mid-2005.
SwifTest-AQ ("Active Quality") software features real-time parts average testing (PAT) capabilities, designed to enable IC manufacturers to meet increasing safety standards and specifications for automotive electronics.
Performs PAT in real-time by calculating PAT limits from baseline data and binning out PAT outliers in real time, avoiding post-processing and subsequent delays in wafer processing.
Industry guidelines for semiconductor quality and reliability have been developed by the Automotive Electronics Council (AEC) to meet increasing safety standards for automotive electronic devices that drive the zero-defect goal for electronic parts.
Meets AEC-Q001 Part Average Testing standards during both wafer probe and final test. The AEC guideline presents a statistically based method for removing parts with abnormal characteristics— those parts that historically contribute significantly to
quality and reliability problems.
Jeff Bibbee, founder and CTO of Pintail Technologies, said, "Instead of post-processing large data files from all testers before calculating the PAT limits from the entire dataset for each test, SwifTest-AQ customers can increase quality dynamically, in real-time, and avoid delays in downstream manufacturing while also optimizing test time and capacity."
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