The touch-up kit is a no-clean, lead-free material set featuring Alpha paste, tacky flux, cored wire and wave soldering flux. Products in combination offer reliability based on SIR Combo testing. Combinations were tested to IPC TM650 2.6.3.7/J-STD 004B with the conditions as 40°C at 90% RH with 12.5 volt bias applied every 20 min.

Alpha Assembly Solutions, www.AlphaAssembly.com  

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PanaCIM Maintenance controls the lifecycle of a manufacturing asset. Provides real-time asset communication to help manufacturers verify, modify, and predict an asset’s maintenance needs. Automatically schedules asset maintenance using predictive data and real-time inputs. Provides variable-based planning by time, usage, and urgency. Records data points such as resource availability and skill level, spare parts, schedules, and procedures. Includes certification and completion tracking. Online manuals, checklists, and certifications help ease deployment, while paperless documentation can automatically link with maintenance orders. Integrates with other platforms such as PanaCIM, machinery, and power tools. Offers framework to add ability to monitor, evaluate, track, and control a manufacturer’s costs. Features include labor tracking, myriad reporting, knowledge base, and automated audit functions.

Panasonic Factory Solutions Company of America, www.panasonicfa.com

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MultiCam inline AOI system is based on the multi-camera image acquisition module MultiEyeS. Provides placement inspection of THT components with a test speed of up to 300 cm²/s. Camera module consists of multiple cameras arranged in a matrix-like configuration with a combined resolution of 120mp. Images, captured in parallel, are merged together with an application-optimized stitching algorithm; no x/y axis movement of the camera head is necessary. Has a footprint of 660mm x 760mm and an inspection area of 490mm x 390mm. Can be operated with Pilot AOI system software.

Goepel electronic, www.goepel.com

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EA6000 spectrometer is for precision microanalysis and mapping analysis. Dual CCD camera system allows precise positioning of large sample while a laser-based collision protection system secures navigation over the sample. Flexible excitation conditions and SDD detector provide fast point analyses and element distribution mappings. Predefined sample points can be measured and evaluated in an automated way. For localized failure analysis on PCB. Elemental range: Na (Z = 11) … U (Z = 92) / detection limit ppm range. Chamber size is 580 x 450 x 150mm.

Hitachi Hi-Technologies, hitachi-hightech.com

Register now for PCB West, the Silicon Valley's largest trade show for the printed circuit industry, taking place Sept. 13-15 in Santa Clara: pcbwest.com