EP3HTS-LO is a single-component epoxy for bonding, sealing and coating applications. Features silver filler; is electrically conductive with a resistivity of less than 0.001 ohm-cm. Has thermal conductivity of 12-15 BTU•in/(ft²•hr•°F). Is dimensionally stable and bonds well to metals, glass, composites, ceramics and many plastics. Withstands chemicals such as water, oils, fuels and cleaning agents. Is serviceable over the temperature range of -60°F to +400°F. Offers handling with no mixing and an unlimited working life at room temperature. Cure schedule is 45 to 50 min. at 250°F or 20 to 30 min. at 300°F. Passes ASTM E595 tests for NASA low outgassing. Is suited for use in the aerospace, electronics, microelectronics and optical industries.

Master Bond, www.masterbond.com

Mydata Agilis Feeder Repair Set converts any Agilis feeder to any of the four sizes to reduce overall feeder count and maximize production capabilities. Provides one kit for each of the sizes (3.7, 4.0, 4.7, and 5.4) for a single feeder ID. Also includes precision machined aluminum side cover plate with cover tape plow preinstalled; new spring; matching screws for re-assembly. All-aluminum construction provides greater strength and durability. Repairs feeders with broken finger tabs. All components are precision-machined replacements for the original parts. Can be installed onsite.

Count On Tools Inc., cotinc.com

AXP shadow moiré system now comes with optional Convection Reflow Emulation Module (CRE6) that allows mirroring of the thermal environment of a reflow oven while conducting warpage metrology. Features increased heating/cooling rates and improved temperature uniformity. Measures warpage on substrates up to 70mm (diameter) with sub-micron z-resolution in a convection reflow environment. Heating rates of up to 5⁰C/sec. allow measurements from 25⁰ to 275⁰C with convective heating and tightly controlled thermal uniformity.

Akrometrix, akrometrix.com

Apreo scanning electron microscope has a proprietary compound final lens design said to be capable of resolution down to 1.0nm at 1kV without the need for beam deceleration. Provides performance on nearly any sample, even if tilted or topographic. 

Offers backscatter detection at low beam currents, at any tilt angle, on sensitive samples and at TV-rate imaging, for strong contrast of materials. Detector segments can be individually addressed to optimize for angular contrast or for signal intensity and extract information that matters most. Low-vacuum capability with a chamber pressure of up to 500 Pa. Has ports for up to three energy dispersive x-ray spectrometry (EDS) detectors, coplanar EDS and electron backscatter diffraction (EBSD), analytics-compatible low-vacuum, and beam currents up to 400nA. Software provides user guidance and “point-and-click” navigation using an in-chamber camera. Load multiple samples quickly and easily without tools. 

FEI, fei.com/apreo