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SN100C (551CT) fluxed-cored solder wire combines the benefits of a eutectic lead-free alloy with a robust, high-temperature capable cored flux for high-speed sequential soldering. Formulated for soldering tip temperatures up to 380°C with good tip separation for reduced icicles, permitting fast wetting and high spreadability. Ag-free stable microstructure accommodates long-term and impact strains. For high-speed robotic soldering. Good wetting and high spread factor.

Nihon Superior, www.nihonsuperior.co.jp/english/

 

No. 970 is a 500ºF electrically-heated, Class 100 cleanroom oven, currently used for sterilizing, depyrogenation, curing and drying workloads. Workspace measures 36" x 42" x 66".  30KW are installed in Incoloy-sheathed tubular elements to heat the oven, while a 2400CFM, 3-HP recirculating blower provides horizontal airflow to the workload. Features 4" thick insulated walls throughout, aluminized steel exterior, Type 304 2B-finish stainless steel interior with continuously backwelded seams, exterior finished with white epoxy paint, #4 brushed finish stainless steel door and control panel face. Includes a 4" insulated floor with removable truck wheel guide tracks. Has a 325CFM stainless steel powered forced exhauster, two 24" x 30" x 12" thick stainless steel high-temperature HEPA recirculating air filters, digital indicating temperature controller, manual reset excess temperature controller with separate contactors, recirculating blower airflow safety switch and a 10" diameter circular chart recording temperature controller. 

The Grieve Corp., www.grievecorp.com

New packaging and labels are available for DMP6-10, DMP8-10 and DMP16-10 inserts. Packaging provides enhanced protection of the DMP inserts during shipping and handling. Prevents contaminants from coming in contact with DMP insert assemblies during storage. Each package has two labels, one affixed to the box and one attached to the inside bag. Labels contain part numbers, descriptions and lot numbers for tracking purposes.

Techcon Systems, www.techconsystems.com

Micro-Coil Spring Array is an alternative to standard rigid arrays. Designed to replace column grid array (solder columns) commonly used on ICs with high lead counts. Is a drop-in replacement for BGA column grid array packaging applications that require greater reliability and long-term robustness. Developed by NASA.

STI Electronics Inc., www.stielectronicsinc.com

I-prober 520 positional current probe observes and measures current in printed circuit board and other conductors without the need to break or surround the conductor. Used with an oscilloscope, this compact, handheld probe provides a bandwidth of DC to 5 MHz and a dynamic range of 10 mA to 20 A pk-pk. When user places insulated tip onto the conductor, the current flowing in the track can be observed and measured. Operates by sensing the field in close proximity to the track. Employs miniaturized version of a fluxgate magnetometer. Has a safety rating of CAT II, 300 V (CAT I, 600 V) and is suitable for connection to any 1-MΩ input of an oscilloscope. Comes with control box and calibrator, power supply, and a clip-on toroid assembly.

Aim-TTi, www.tti-test.com/products-tti/precision/iprober520.htm

ScanExpress boundary-scan tool suite v. 7.6 CD includes JTAG embedded test support for AMD Family 10 processors; enables processor emulation-based testing capabilities on AMD ASB2 (BGA), Opteron 4100, and Quad-Core Opteron CPUs. Integrates with National Instruments’ high-speed digital I/O (HSDIO) hardware. Supports 655x series of digital instruments with JTAG test clock (TCK) rates of up to 30 MHz. Other improvements include new test scripting functions and features, including direct JTAG scan functions, global script variables, and test time stamping; new pin direction constraints for TPG’s test vector generator; overhauled topology viewer, including a visual representation of all components on the scan chain, including series resistors, and test connectors; support for Blackhawk XDS560v2 series JTAG controllers, and JTAG embedded test support for Freescale i.MX51 and Texas Instruments’ AM/DM37x processors.

Corelis, www.corelis.com/education/JTAG_Boundary-Scan_Seminars_and_Training.htm

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