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Valueflex turnkey line is for short-run to midrange high-precision surface mount assembly, including high-mix runs. MC-385V1V pick-and-place machine has placement speeds to 5,000 cph and capacity for up to 128 feeders. Ball-screw drive, high-speed AC servo motors, and X&Y linear encoders are for components from 0201 to 100mm x 150mm, with 01005 capability as an option. Four-zone, full-convection, Pb-free reflow oven (model CR4000T) accommodates boards 20" wide. MC100 stencil printer has fine-pitch capability of 0.3mm and registration repeatability to ±0.02mm. Includes adjustable magnetic support pins and self-locking X, Y, Z and theta adjustments. Level 2 upgrade increases placement speed by about 50% with dual placement heads. Computer control and KIC profile prediction software are added to the reflow oven, along with a 16"-wide pin conveyor over the mesh belt. 

Manncorp, www.manncorp.com

The VP5200V inline, high-speed 3D solder paste inspection system reportedly completes inspection cycles 2x faster than conventional models, using the phase shift method to measure height. Program generation times are fewer than 10 min. Has one-touch operation through touch panel control. Offers height inspection (within 1 ìm) and volume inspection (within 3%). Available models offer horizontal resolution of 15 ìm or 25 ìm.

Omron Inspection Systems, www.omron247.com

Servo-Flo 105-HV high-volume, variable-ratio meter system is for meter-mix dispensing processes for two-part materials. Dispenses up to 35 in3, 575 cc, of metered and mixed material at 1:1 ratio. Dual servo motor allows ratio to be adjusted without mechanical changes to the machine. Is a positive rod displacement metering system. Independent servo motors permit each meter to pre-pressurize to the correct setting. Provides different shot volume sizes, consistent bead diameters, and responds to flow rate inputs for varying robot movement speeds. More than 250 pre-programmed dispense settings for different part sizes.

Sealant Equipment & Engineering, www.SealantEquipment.com

Renew Bath Analysis Kit (part #1590-KIT), for use with Eco-dFluxer SMT100 (1550) and Eco-Stencil AQ (1572) water-based inline and batch cleaners, tests concentration and loading of a batch solution. A testing protocol keeps cleaning process from drifting, with either concentration levels dropping, or bath becoming so loaded with flux residues that it no longer functions properly.

Techspray, http://www.techspray.com

SMT Place 2000 manual pick-and-place system places up to 800 components per hour using an easy gliding positioning head and sliding armrest that steadies the arm for accurate placements and reduced operator fatigue. Intelligent, auto-on/auto-off vacuum. For prototyping, pre-production runs, engineering changes, SMD placements on boards with high through-hole parts counts, odd form placements and small batch and low-volume assembly. Picks from bins, tapes & tape strips. Loose SMDs are picked from the included 45-bin, ESD-safe parts carousel. Tape strip holders permit components to be purchased only in the quantities needed. Two tape strip feeders can be mounted on the built-in feeder rack for a total of six 8mm, two 12mm and two 16mm cut tape strips. Built-in rack also holds 8mm and 12mm reel tape feeders. In all, up to 57 different component types can be loaded on the machine at once. Comes with integrated dispense syringe mounted on placement head.

Manncorp, www.manncorp.com/manual-placers/smt-place-2000/

Verios XHR scanning electron microscopy (SEM) provides sub-nanometer resolution and enhanced contrast. Advanced optics reportedly deliver impressive sensitivity to surface detail at low kV. Users may switch quickly between various operating conditions, maintain sample cleanliness, and obtain sub-nanometer resolution at any accelerating voltage from 1 kV to 30 kV. Optimized signal collection and advanced filtering abilities provide higher, more flexible contrast generation, and a greater range of samples to be investigated. Many beam-sensitive or non-conductive materials can now be accurately observed at the nanoscale, without preparation.

FEI, www.fei.com

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