Point of Use Ionizing Blower Model 6422/6422e is a small-footprint ionizer for semiconductor assembly and test processes including die preparation, bonding, molding and other robotic tool, final assembly applications. Features an operational failure alarm and a Facility Monitoring System (FMS) interface connection (model 6422e).
Both models feature steady-state DC ion emission for a high degree of air ion delivery sophistication with low ion recombination rates. The blower also features patented IsoStat balancing technology, so the ionizer never needs calibration and always stays in balance.
Powered by 24 VAC line power or 24 VDC tool power. A specialized mounting bracket allows installation into tight spaces for increased versatility.
Ion, ion.com
Both models feature steady-state DC ion emission for a high degree of air ion delivery sophistication with low ion recombination rates. The blower also features patented IsoStat balancing technology, so the ionizer never needs calibration and always stays in balance.
Powered by 24 VAC line power or 24 VDC tool power. A specialized mounting bracket allows installation into tight spaces for increased versatility.
Ion, ion.com
Cencorp 500 Visual Inspection Cell (VIC) for electronics manufacturing can also be used in functional testing.
"Compared to AOI solutions, the 500 VIC is a simpler, more affordable solution for quality control and product monitoring. The same equipment can also be used in functional testing, like checking the functioning of a keyboard. This makes it an even more cost-effective solution, as you can combine multiple functions in one cell," said business unit manager Arto Timonen.
The cell can be applied to barcode reading, inspection of label positioning or scratches, and it can check PCBs for missing or misplaced components. The high-resolution camera can scan a field of view of only 10 x 7 mm.
The company believes using automation instead of people in visual inspection will improve throughput and quality. "It is inevitable that people get tired in a fairly short span of time when they have to check complex boards or products by eye. A machine never gets tired, so it can do the inspection faster and without fail which in the long run improves overall production reliability and quality," Timonen said in a press release.
Cencorp Corp., cencorp.com
"Compared to AOI solutions, the 500 VIC is a simpler, more affordable solution for quality control and product monitoring. The same equipment can also be used in functional testing, like checking the functioning of a keyboard. This makes it an even more cost-effective solution, as you can combine multiple functions in one cell," said business unit manager Arto Timonen.
The cell can be applied to barcode reading, inspection of label positioning or scratches, and it can check PCBs for missing or misplaced components. The high-resolution camera can scan a field of view of only 10 x 7 mm.
The company believes using automation instead of people in visual inspection will improve throughput and quality. "It is inevitable that people get tired in a fairly short span of time when they have to check complex boards or products by eye. A machine never gets tired, so it can do the inspection faster and without fail which in the long run improves overall production reliability and quality," Timonen said in a press release.
Has modular structure, can be connected to different test platforms.
Cencorp Corp., cencorp.com
Available off the shelf, lightweight and sturdy Flat PCB trays hold up to 25 cards for storage and transport at manual workstations. Will hold virtually any PCB size. Are made of conductive material, temperature rated up to 176O F. Four rails of slots 0.63” center to center will hold cards up to .12" thick. Slots are .3" deep. Trays can be fixed side-by-side for longer PCB panels.
FKN Systek, Fknsystek.com
YTX-3000 HXR x-ray inspection system for extremely high-resolution applications features an open-tube transmission target x-ray source with an integral high-voltage power supply and computer-controlled operation. Resolves sub-micron features with zoom magnifications up to 2400x. Is designed for minimum maintenance, with an easily replaceable filament and target assembly.
Available with a four or five axes sample manipulator and a 15 x 20" (380 x 500 mm) x-y travel for samples up to 5 pounds. Full 360° rotation and 30° of tilt are available. Computer-controlled motor drives provide a rage of motion from ultra-slow use at high magnifications, to high speed for travel over large distances. Comes with a unique control module and programmable motion for automated inspection.
YESTech, yestechinc.com
Available with a four or five axes sample manipulator and a 15 x 20" (380 x 500 mm) x-y travel for samples up to 5 pounds. Full 360° rotation and 30° of tilt are available. Computer-controlled motor drives provide a rage of motion from ultra-slow use at high magnifications, to high speed for travel over large distances. Comes with a unique control module and programmable motion for automated inspection.
YESTech, yestechinc.com
Touch 1 Ultra combines the Signature Touch 1 cable tester with the Associated Research Hypot Ultra lll Hipot tester into a system capable of testing assemblies of up to 256 points at voltages to 2800VDC and 2000VAC.
Ideal for cables, connectors, flex circuits and other interconnect devices that must be tested at high voltage, offers I.R. testing to 50GW and DWV thresholds from .1mA to 1.5mA (real) and 30mA (total) current.
Has menu-driven touch screen, can self-learn from a sample wiring assembly and can programmed via the onboard editor or an imported program.
Uses new HVI (High Voltage Interconnect) interface scheme. The 4 column x 28 row test block allows you to build individual interface cables, or HVI Plugs, in four-pin increments, i.e. 4 pin, 8 pin, 12 pin, etc.
Cirris Systems Corp., cirris.com
Ideal for cables, connectors, flex circuits and other interconnect devices that must be tested at high voltage, offers I.R. testing to 50GW and DWV thresholds from .1mA to 1.5mA (real) and 30mA (total) current.
Has menu-driven touch screen, can self-learn from a sample wiring assembly and can programmed via the onboard editor or an imported program.
Uses new HVI (High Voltage Interconnect) interface scheme. The 4 column x 28 row test block allows you to build individual interface cables, or HVI Plugs, in four-pin increments, i.e. 4 pin, 8 pin, 12 pin, etc.
Cirris Systems Corp., cirris.com
A new module in the boundary scan hardware platform Scanflex, SFX1149.4, provides resources for the test of analog circuits based on the IEEE Std. 1149.4.
“We have discussed the subject of 1149.4 frequently at technology events such as our worldwide Boundary Scan Days. This has enabled us now to introduce the first JTAG/Boundary Scan benchtop system for dot1/dot4 mixed-signal applications, just in time to support customer projects entering the prototyping stage,” said Thomas Wenzel, director of the business unit boundary scan.
The module provides one complete dot4 test bus (AT1, AT2) and can be plugged directly onto an SFX TAP transceiver. To support applications with multiple dot4 test busses, several modules can be integrated in a SFX-Carrier. The module provides advanced functions for R, L and C measurements, and the generation and measurement of AC and DC signals with programmability in voltage, current and frequency. Provides a ramp function coupled with a programmable digitizer to digitally record response signals.
Is fully supported in software System Cascon v. 4.3, including the automated recognition of the instrument through the AutoDetect feature. The Cascon Application Programming Interface (CAPI) enables integration in other test systems, also providing access to the dot4 functions and measurements from external control software.
GÖPEL electronic, goepel.com
“We have discussed the subject of 1149.4 frequently at technology events such as our worldwide Boundary Scan Days. This has enabled us now to introduce the first JTAG/Boundary Scan benchtop system for dot1/dot4 mixed-signal applications, just in time to support customer projects entering the prototyping stage,” said Thomas Wenzel, director of the business unit boundary scan.
The module provides one complete dot4 test bus (AT1, AT2) and can be plugged directly onto an SFX TAP transceiver. To support applications with multiple dot4 test busses, several modules can be integrated in a SFX-Carrier. The module provides advanced functions for R, L and C measurements, and the generation and measurement of AC and DC signals with programmability in voltage, current and frequency. Provides a ramp function coupled with a programmable digitizer to digitally record response signals.
Is fully supported in software System Cascon v. 4.3, including the automated recognition of the instrument through the AutoDetect feature. The Cascon Application Programming Interface (CAPI) enables integration in other test systems, also providing access to the dot4 functions and measurements from external control software.
GÖPEL electronic, goepel.com
Press Releases
- Saki to Highlight Advanced Inspection Innovation at 39th Nepcon Japan
- ViTrox Welcomes Gemaddis as a New Sales Channel Partner in France
- NCMS Releases White Paper: “Artificial Intelligence to Improve Supply Chain Resilience Throughout American Manufacturing”
- E-tronix Expands Team with Strategic Hires to Strengthen Technical Solutions Support in 2025