The Micromex submicron, high-resolution system is optimized for manual and semi-automated solder joint inspection of BGA, CSP, MLF and QFP components. Has an integrated 2 megapixels camera, open 160kV or 180kV submicron x-ray tube and total magnification of up to 13.3X for process control and failure analysis of PCB assemblies.
Comes with new inspection software, quality|assurance 2006. This software automates inspection of PCB assemblies, making pass/fail decisions for BGA, CSP, MLF and QFP without operator interpretations, reducing the numbers of false identifications while speeding throughput and improving efficiency. A powerful algorithm toolbox XE offers solutions for application testing.
Possesses high precision manipulation through its 360° rotation axis and the ability for oblique views up to 70°. A scanning area of 18x14” allows samples with a size up to 26.75 x 25” (680 x 635 mm) with weights of up to 11 lbs. (5 kg).
Comes with new inspection software, quality|assurance 2006. This software automates inspection of PCB assemblies, making pass/fail decisions for BGA, CSP, MLF and QFP without operator interpretations, reducing the numbers of false identifications while speeding throughput and improving efficiency. A powerful algorithm toolbox XE offers solutions for application testing.
Possesses high precision manipulation through its 360° rotation axis and the ability for oblique views up to 70°. A scanning area of 18x14” allows samples with a size up to 26.75 x 25” (680 x 635 mm) with weights of up to 11 lbs. (5 kg).
Phoenix X-ray Systems + Services Inc., phoenix-xray.com
Henkel has developed a die attach and mold compound material set that is Pb-free compatible and designed for thin and ultra-thin surface-mount device applications.
Combined, the Hysol QMI529LS die attach material and Hysol GR828A mold compound deliver the thin, yet highly reliable, materials properties necessary for packages in low-profile products such as cell phones, PDAs, portable music players and entertainment devices .
When manufacturing TSOP, TSSOP and TQFP packages with Au-plated and Ag-plated lead frames, use of the die attach adhesive with the “Green” mold compound reportedly produces superior material set reliability and performance. QMI529LS’ formulation provides hydrophobic properties, while delivering stability at high temperatures. GR828A is a low stress molding compound that exhibits excellent gate leakage performance. Testing of this materials combination to JEDEC Level 1, 260°C has confirmed robust performance even in demanding Pb-free manufacturing conditions.
Henkel,is one of the world’s leading and most progressive providers of qualified, compatible material sets for semiconductor packaging, board level assembly and advanced soldering solutions. Through its Hysol, Loctite and Multicore brands, and its global customer support infrastructure, the electronics group of Henkel delivers world-class materials products, process expertise and total solutions across electronics.henkel.com
Combined, the Hysol QMI529LS die attach material and Hysol GR828A mold compound deliver the thin, yet highly reliable, materials properties necessary for packages in low-profile products such as cell phones, PDAs, portable music players and entertainment devices .
When manufacturing TSOP, TSSOP and TQFP packages with Au-plated and Ag-plated lead frames, use of the die attach adhesive with the “Green” mold compound reportedly produces superior material set reliability and performance. QMI529LS’ formulation provides hydrophobic properties, while delivering stability at high temperatures. GR828A is a low stress molding compound that exhibits excellent gate leakage performance. Testing of this materials combination to JEDEC Level 1, 260°C has confirmed robust performance even in demanding Pb-free manufacturing conditions.
Henkel,is one of the world’s leading and most progressive providers of qualified, compatible material sets for semiconductor packaging, board level assembly and advanced soldering solutions. Through its Hysol, Loctite and Multicore brands, and its global customer support infrastructure, the electronics group of Henkel delivers world-class materials products, process expertise and total solutions across electronics.henkel.com
Model 325 Electrostatic Voltmeter, an ultra-sensitive instrument which is ideal for noncontacting electrostatic voltage measurement and monitoring in applications within high-tech, semiconductor, materials processing, materials science and R&D sectors.
Designed for applications that require highly accurate, low noise, noncontacting measurement of electrostatic voltages from millivolts to +/- 40 V over a range of probe-to-surface distances.
Applications include electrostatic monitoring of devices sensitive to ESD, and testing of the reliability and characteristics of dielectric materials and films in electronic applications.
In semiconductors, is designed to measure the surface potential of bare or processed wafers to analyze doping and thin film characteristics. Also useful for measurements of polarization, residual charge and characterization of electrostatic chucks.
Can monitor electrostatic charge where the build-up of such charge can cause productivity or yield problems, as in high-end processing of paper, plastic, textile or other film products.
In materials science and R&D, applications include contact potential (surface work function) determination, materials evaluation and electret studies.
Features include sensitivity of 1 mV, speed of response less than 3 ms and accuracy better than 0.05% of full scale. Low impedance probe sensor assures measurement accuracy which is essentially independent of probe-to-test-surface spacing while eliminating the external environmental effects of high humidity and contamination on measurement accuracy. Contaminants include airborne dust, ions, chemicals and other particulates.
Offers a higher performance alternative to Model 320C Electrostatic Voltmeter with faster speed of response, lower noise and higher accuracy. Smaller probe also increases the unit’s utility in space-constrained environments. Designed to address demanding semiconductor parameters for permittivity, oxide thickness and integrity, contact potentials and higher-speed automated voltage profile scanning.
Special features allow tuning the performance of the unit to compensate for specific test conditions. Can be operated as a bench top unit or in a standard rack (with optional hardware).
TREK, Inc., trekinc.com
Designed for applications that require highly accurate, low noise, noncontacting measurement of electrostatic voltages from millivolts to +/- 40 V over a range of probe-to-surface distances.
Applications include electrostatic monitoring of devices sensitive to ESD, and testing of the reliability and characteristics of dielectric materials and films in electronic applications.
In semiconductors, is designed to measure the surface potential of bare or processed wafers to analyze doping and thin film characteristics. Also useful for measurements of polarization, residual charge and characterization of electrostatic chucks.
Can monitor electrostatic charge where the build-up of such charge can cause productivity or yield problems, as in high-end processing of paper, plastic, textile or other film products.
In materials science and R&D, applications include contact potential (surface work function) determination, materials evaluation and electret studies.
Features include sensitivity of 1 mV, speed of response less than 3 ms and accuracy better than 0.05% of full scale. Low impedance probe sensor assures measurement accuracy which is essentially independent of probe-to-test-surface spacing while eliminating the external environmental effects of high humidity and contamination on measurement accuracy. Contaminants include airborne dust, ions, chemicals and other particulates.
Offers a higher performance alternative to Model 320C Electrostatic Voltmeter with faster speed of response, lower noise and higher accuracy. Smaller probe also increases the unit’s utility in space-constrained environments. Designed to address demanding semiconductor parameters for permittivity, oxide thickness and integrity, contact potentials and higher-speed automated voltage profile scanning.
Special features allow tuning the performance of the unit to compensate for specific test conditions. Can be operated as a bench top unit or in a standard rack (with optional hardware).
TREK, Inc., trekinc.com
K-Alpha materials characterization instrument uses x-ray photoelectron spectroscopy to quantitatively determine the surface chemical composition of the top few nanometers of solid materials. Insulators, semiconductors and metals can be analyzed in a user-friendly, reliable and automated way. An integral ion source provides a high-resolution depth profiling capability, thus facilitating true 3D analysis. For high-throughput sample analysis.
Thermo Electron Corp., thermo.com/surfaceanalysis
Thermo Electron Corp., thermo.com/surfaceanalysis
The VPD-5 depaneler is said to permit stress-free board separation with components (inlcuding ceramic capacitors) as close as 0.5 mm from the score line. Reportedly handles boards as thin as 0.32", and can separate boards with tall components near the score line (up to 0.800" from the top of the PCB). Panel insertions limited to the score line, preventing operator errors. In two models; for boards up to 10" and 13", respectively.
Fancort Industries, fancourt.com
Fancort Industries, fancourt.com
Hysol QMI536NB non-conductive PTFE-filled paste is for stacked die applications that require extremely low stress and robust mechanical properties. Can be used on all levels of a stacked die, enabling the qualification of a single material. Is said to eliminate provide very low resin bleed and very fast cure. Can be used on solder resist, bare silicon and multiple die passivations. Is lead-free compatible, showing no reliability issues or material deterioration even when processed in higher temperature environments. shows high resistance to delamination and popcorning after multiple exposures to 260°C reflow temperatures.
Henkel, www.electronics.henkel.com
Henkel, www.electronics.henkel.com
