The AX-201 places many different types of components with a reported accuracy of better than 20 microns at single-digit defects per million. Places 01005 components, fine-pitch devices and odd-form components up to 130 x 79 mm with machine vision and laser alignment. Is suitable for both stand-alone and line-balancing applications with the AX-301 or AX-501. It has a placement rate of up to 18,000 cph. Placement force is programmable from 0.9 to 40 N. Feeders are configurable to hold up to 212 pick positions and 376 Jedec trays. Shares common user interface, feeders, trolleys and placement heads with other A-Series machines. Is designed for medium and large batch production in both high and low product mix environments. 
 
Assembléon, www.assembleon.com

The Handheld Laser-Focus Camera System for small-spot testing captures a digital picture and test results for compliance RoHS screening tests in an XRF Analyzer. Isolates test areas by placing a test spot down to 3 mm diameter and displaying the image and sample target on the color PDA screen in real-time. Ideal for evaluating non-homogeneous parts such as PCBs where the beam can be focused on a small component, solder joint, lead or terminal. Can switch from collimated pinpoint to full-field analysis. Snapshot images of samples analyzed plus laser-targeted small-spot analysis are saved in test records. Said to measure up to 25 elements in a single test. 
 
Innov-X Systems, www.innov-x-sys.com

 The X-50 Mobile XRF tests Cd to 1 ppm in many sample types, 10 ppm in alloys. Ideal for RoHS Packaging Directive, which requires sum of Cd, Hg, Pb, Cr less than 100 ppm. The Inspector Series XRF tests Pb content in solder and parts. Alerts users to banned metals using pass/fail criteria and documents total Cr, Br, Pb, Hg, and Cd. Angled front display plus rear display for easy viewing of test results; no wipe tests; said to eliminate the liability of isotope control, improper use, theft and disposal.
 
Innov-X Systems, www.innov-x-sys.com

Hawk Micro XRF benchtop analyzers deliver identification and elemental analysis from Ch to U. Use collimated beam of 13 to 0.2 mm diameter, with laser beam focusing. Ideal for testing small or nonhomogeneous samples. Applications include RoHS compliance analysis for electronics, PCB and components. Reportedly can perform standard-less quantitative analysis with statistical accuracy. Movable X-Y stage affords precise measurements across samples. A color CCD camera enables digital snapshots with magnification of up to 68X; combined with the laser spot tool, enables digital pictures to be analyzed and stored. Includes a large testing chamber, X-ray tube source and Si PiN-diode detector interfaced to a PC. 
 
Innov-X Systems, www.innov-x-sys.com