SwifTest software platform has new quality assurance features that support Inline QA and real-time trend analysis using Western Electric Co. (WECO) rules.
Inline QA solution randomly selects a configurable number of passing devices and re-bins them to a specific QA bin automatically - resulting in a consistent sample size spread throughout the lot that provides a more uniform representation of the lot. Enables better visibility and QA sampling across an entire lot. For multi-site testing, passing parts are selected from all sites, ensuring measurement of an adequate number of QA samples.
WECO rules measure the quality of stable manufacturing processes while enhancing sensitivity to trends.Violation of WECO rules usually signals major production issues and requires immediate attention. Real-time trend analysis following WECO guidelines immediately notifies test station operators and responsible engineers when rules are violated.
"Pintail is proud to be the first company to offer real-time inline QA and WECO monitoring capabilities to the semiconductor industry for probe and wafer test without impacting the current test process," said Jeff Bibbee, CTO. "Test operations, in particular, should benefit since they have typically been required to perform inline QA by stopping production to manually re-test parts, which hurts operational efficiencyand throughput."
The WECO rules are a standard feature included with SwifTest-Monitor. Inline QA is available as a separately licensed module.
Pintail Technologies, www.pintail.com
Now available: MiniMate (MMSD Series) with wire gauges from 20 to 30 AWG and PowerMate (IPBD Series) with wire gauges from 16 to 24 AWG. MiniMate cable and connectors are rated at up to 6 amps at 20°C, with PowerMate rated at up to 12 amps at 20°C.
Standard assemblies can be specified from the catalog for any cable length with a variety of pin counts and termination orientations. Also available are mating PCB-mount connector shells and contacts as components for customer assembly.
A range of assembly tooling is also available. Hand tools (CAT-HT) are ideal for low volume, pre-production and repair applications, while bench-top terminating units (CAT-3000 Series) and mini applicators (CAT-MA Series) allow quick change and semi-automated terminating with press capacities up to 3000 pounds.
Samtec Inc., www.samtec.com
OptiCon AdvancedLine is a new hardware platform for AOI that guarantees high fault coverage. The centerpiece of the new family is a modularly extendable camera that allows alternative selection between a one and four mega-pixel camera module. Users can add additional camera options for THT components, color inspection or 3-D measurement as well as angled view inspection for the inspection of J-Lead pins at PLCC and SOJ components.
Designed to offer higher test speed, reduced debug times, minimal false call rate and high fault coverage. The platform has an all new appearance and space for further options and capability.
The four mega-pixel camera with system-specific telecentric lens allows an inspection field of 40 X 40 mm at a 21 µm resolution. TOP lighting provides multicoloured LED illumination with three basic colors controllable separately. Quattro illumination with 16 illumination settings enables the display of shorts, laser labelling and polarity markings.
GÖPEL electronic GmbH, www.goepel.comww.goepel.com
FrameScan FX is an advanced vectorless test tool for detecting open pins on components and connectors assembled onto PCBs. Uses an enhanced in-circuit capacitive coupling technique that tests for open pins by applying an AC signal to an un-powered PCB node and measuring the voltage coupled to a plate positioned in close proximity to the component or connector being tested. Users can reportedly detect open pins more accurately and with greater repeatability.
The complete hardware and software suite can extend measurement capabilities. Solves test issues associated with smaller device packages and connector technologies. Hardware improvements include a new low-noise op amp that increases the front-end gain of the active probe to minimize the effects of noise upon other stages of the measurement circuit. Software improvements include an automatic Precision Mode that increases the number of measurement samples for low measurement signals.
Teradyne, www.teradyne.com